AUTOMATE TEST SEQUENCING WITH NEW VERSION OF LABVIEW TEST EXECUTIVE

Provides Improved Flexibility for Production and Manufacturing Test
Applications

Austin, Texas -- Aug. 16, 1995 -- National Instruments -- the Virtual
Instrumentation Company -- announced today a new version of the company's
LabVIEW Test Executive. This library of virtual instruments (VIs) is used
to create test sequences and control test execution for production and
manufacturing automated test applications. The Test Executive includes an
intuitive, multilevel user interface for displaying test results; operator
and UUT serial number prompts; pass/fail banners; and run-time error
reporting. Test developers can combine the Test Executive with the
company's LabVIEW software as well as hardware for instrument control,
data acquisition (DAQ), and signal conditioning to automate test sequences
using Windows and Windows NT PCs, Macintosh and Power Macintosh computers,
Sun SPARCstations, and Hewlett-Packard 9000 Series 700 workstations. A
run-time version of the LabVIEW Test Executive is also available.

About the New LabVIEW Test Executive

With the new LabVIEW Test Executive, users benefit from performance
improvements and simplified test development, sequence editing, and
control. Test sequence execution speed has been greatly improved. With the
new built-in execution timer, users can now record individual test
execution and overall sequence execution times. In addition, the Test
Executive features dynamic loading, so users can selectively load tests
into memory only when they are needed. Thus, with the LabVIEW Test
Executive, users can build and run extensive test sequences using a
minimum of memory, while maximizing performance.

The new Sequence Editor and Dependency Editor offer advanced test
dependency control. With these, users can now create complex test
dependencies simply by using built-in AND, OR, and GOTO statements. With
the new Sequence Report Generation feature, users can easily document test
sequence operations.

Additionally, users can now edit their tests directly from the Sequence
Editor without leaving the Test Executive environment. Users can call
tests from a variety of languages, including LabVIEW, LabWindows/CVI,
C/C++, Visual Basic, Pascal, and Fortran. Users can also access any
instrument via the Instrument Driver Library, or by using calls located in
the standard National Instruments GPIB, VXI, and serial instrument I/O
libraries.

The updated Test Executive features a modular architecture for enhanced
test code and test sequence reuse and extensibility. It is shipped with
user-modifiable graphical user interfaces (GUIs) for the operator
interface, login panel, and pass/fail banners. Users can easily link the
LabVIEW Test Executive to the LabVIEW SQL Toolkit and the LabVIEW SPC
Toolkit to save test results to a database and perform statistical process
control methods to analyze and track results. Users can log test data for
use with other data collection and analysis packages as well.

About National Instruments

National Instruments, headquartered in Austin, Texas, manufactures software
and hardware products for PCs and workstations that scientists and
engineers worldwide use to build virtual instrumentation systems. These
systems are used for research and industrial applications such as
automated testing, laboratory automation, advanced research, industrial
control, factory automation, physiological monitoring, numerical analysis,
and data visualization.

National Instruments stock is traded on the NASDAQ National Market System
under the symbol NATI. Further information on National Instruments may be
obtained from the company's SEC filings or by directly contacting the
company's Investor Relations Department at (512) 338-9119.

For more information about the LabVIEW Test Executive, please contact

National Instruments,
6504 Bridge Point Parkway
Austin, Texas 78730-5039
(512) 794-0100.

Or call toll free in the U.S. and Canada at (800) 433-3488, fax (512)
794-8411, e-mail info@natinst.com. Readers can also access information
through the National Instruments InstrumentationWeb at
http://www.natinst.com/
 
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